TEST_NAME : Wafer
TEST_DATE : 24_08_21-14_38_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-006-020-00 | FUSED_ID : 6359364768383394112
  IC_TEMP :  -68.16 | VDDM : 1110.12 | AUX_INT :    0.00 | CsaBias :   59.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.92505e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.10246e-02
  ADC_P1  : 8.49317e-03 ± 5.18000e-04
  ADC_P2  : -5.10572e-06 ± 3.17421e-06
  CSA_Chi2/NDF : 1.93193e-04 / 2
  CSA_P0  : 5.88086e-02 ± 9.27081e-03
  CSA_P1  : 1.07064e-02 ± 6.98489e-04
  CSA_P2  : -6.81655e-05 ± 1.06372e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [14, 18, 23, 37, 40, 46, 51, 53, 72, 77, 88, 110, 118, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [18, 22, 35, 60, 63, 86, 92, 121, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2542', '1.800', '0.1784', '1.799', '0.0932', '7.000', '0.7076', 1, 1, 1, 1, 1724243911.5869372]
VI_after__Init : ['1.201', '0.2549', '1.800', '0.1787', '1.803', '0.0874', '7.000', '0.7076', 1, 1, 1, 1, 1724243920.4883015]
VI_at__the_End : ['1.201', '0.4572', '1.800', '0.1384', '1.799', '0.1165', '7.000', '0.7084', 1, 1, 1, 1, 1724243979.976719]