TEST_NAME : Wafer
TEST_DATE : 24_08_21-14_40_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-006-021-00 | FUSED_ID : 6359364768383394128
  IC_TEMP :  -60.14 | VDDM : 1123.53 | AUX_INT :    0.00 | CsaBias :   68.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31907e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.56814e-02
  ADC_P1  : 8.58577e-03 ± 4.22759e-04
  ADC_P2  : -6.09815e-06 ± 2.55282e-06
  CSA_Chi2/NDF : 1.52437e-04 / 2
  CSA_P0  : 5.76521e-02 ± 8.23509e-03
  CSA_P1  : 1.04991e-02 ± 6.20454e-04
  CSA_P2  : -5.90507e-05 ± 9.44879e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [5, 46, 50, 59, 62, 71, 82, 86, 90, 96, 98, 104, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [3, 5, 30, 32, 33, 44, 49, 68, 71, 75, 87, 104, 118, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2638', '1.800', '0.1587', '1.800', '0.0873', '7.000', '0.7077', 1, 1, 1, 1, 1724244007.1146812]
VI_after__Init : ['1.201', '0.2640', '1.800', '0.1587', '1.800', '0.0816', '7.000', '0.7077', 1, 1, 1, 1, 1724244015.8969944]
VI_at__the_End : ['1.201', '0.4830', '1.800', '0.1393', '1.800', '0.1151', '7.000', '0.7082', 1, 1, 1, 1, 1724244078.32028]