TEST_NAME : Wafer
TEST_DATE : 24_08_21-14_41_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-006-022-00 | FUSED_ID : 6359364768383394144
  IC_TEMP :   -1.16 | VDDM : 1048.13 | AUX_INT :    0.00 | CsaBias :   50.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.79546e-02 / 2
  ADC_P0  : 0.00000e+00 ± 2.21308e-01
  ADC_P1  : 5.46638e-03 ± 3.05065e-03
  ADC_P2  : 1.01412e-05 ± 1.81332e-05
  CSA_Chi2/NDF : 1.70472e-04 / 2
  CSA_P0  : 5.79123e-02 ± 8.70862e-03
  CSA_P1  : 9.80777e-03 ± 6.56131e-04
  CSA_P2  : -5.02843e-05 ± 9.99211e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [3, 28, 31, 36, 37, 42, 66, 68, 72, 74, 80, 88, 91, 118, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [25, 38, 52, 53, 63, 69, 72, 80, 96, 100, 107, 113, 118, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3081', '1.800', '0.1400', '1.800', '0.0870', '7.000', '0.7076', 1, 1, 1, 1, 1724244101.9954903]
VI_after__Init : ['1.201', '0.3082', '1.800', '0.1400', '1.800', '0.0811', '7.000', '0.7075', 1, 1, 1, 1, 1724244110.7997577]
VI_at__the_End : ['1.201', '0.4724', '1.800', '0.1340', '1.800', '0.1146', '7.000', '0.7085', 1, 1, 1, 1, 1724244172.258954]