TEST_NAME : Wafer
TEST_DATE : 24_08_21-14_43_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-006-023-00 | FUSED_ID : 6359364768383394160
  IC_TEMP :  -62.18 | VDDM : 1123.60 | AUX_INT :    0.00 | CsaBias :   84.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73381e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.94432e-02
  ADC_P1  : 8.47395e-03 ± 4.86499e-04
  ADC_P2  : -5.32942e-06 ± 2.95195e-06
  CSA_Chi2/NDF : 1.82953e-04 / 2
  CSA_P0  : 5.87266e-02 ± 9.02177e-03
  CSA_P1  : 1.01315e-02 ± 6.79726e-04
  CSA_P2  : -5.44340e-05 ± 1.03514e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [18, 30, 41, 49, 56, 62, 74, 77, 90, 102, 106, 108, 111, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [6, 8, 16, 21, 37, 74, 77, 80, 88, 90, 91, 105, 123, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2530', '1.800', '0.1778', '1.800', '0.0917', '7.000', '0.7086', 1, 1, 1, 1, 1724244198.5790312]
VI_after__Init : ['1.201', '0.2527', '1.800', '0.1778', '1.800', '0.0842', '7.000', '0.7076', 1, 1, 1, 1, 1724244206.6525095]
VI_at__the_End : ['1.201', '0.4738', '1.800', '0.1365', '1.799', '0.1160', '7.000', '0.7086', 1, 1, 1, 1, 1724244269.8466864]