TEST_NAME : Wafer
TEST_DATE : 24_08_21-15_24_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-007-004-10 | FUSED_ID : 6359364768383397962
  IC_TEMP :  -66.74 | VDDM : 1121.65 | AUX_INT :    0.00 | CsaBias :   68.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25301e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.50301e-02
  ADC_P1  : 8.57263e-03 ± 4.13215e-04
  ADC_P2  : -6.09649e-06 ± 2.49100e-06
  CSA_Chi2/NDF : 2.08308e-04 / 2
  CSA_P0  : 5.78678e-02 ± 9.62666e-03
  CSA_P1  : 1.00045e-02 ± 7.25300e-04
  CSA_P2  : -5.60784e-05 ± 1.10455e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [16, 25, 38, 42, 44, 53, 66, 74, 75, 82, 83, 101, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [2, 3, 12, 57, 74, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1346', '1.800', '0.1769', '1.800', '0.0903', '7.000', '0.7084', 1, 1, 1, 1, 1724246680.5232923]
VI_after__Init : ['1.201', '0.1347', '1.800', '0.1768', '1.799', '0.0827', '7.000', '0.7076', 1, 1, 1, 1, 1724246688.6567333]
VI_at__the_End : ['1.201', '0.4628', '1.800', '0.1370', '1.800', '0.1172', '7.000', '0.7083', 1, 1, 1, 1, 1724246748.4591403]