TEST_NAME : Wafer
TEST_DATE : 24_08_21-15_19_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-007-007-10 | FUSED_ID : 6359364768383398010
  IC_TEMP :  -62.27 | VDDM : 1117.14 | AUX_INT :    0.00 | CsaBias :   66.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64084e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.86429e-02
  ADC_P1  : 8.34584e-03 ± 4.53206e-04
  ADC_P2  : -5.98830e-06 ± 2.64206e-06
  CSA_Chi2/NDF : 1.76072e-04 / 2
  CSA_P0  : 5.85647e-02 ± 8.85050e-03
  CSA_P1  : 1.02975e-02 ± 6.66821e-04
  CSA_P2  : -5.81527e-05 ± 1.01549e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [5, 39, 43, 52, 65, 70, 72, 73, 75, 78, 96, 97, 101, 109, 115, 121, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [7, 8, 18, 21, 25, 31, 41, 47, 54, 56, 82, 85, 93, 95, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1625', '1.800', '0.1936', '1.799', '0.0866', '7.000', '0.7078', 1, 1, 1, 1, 1724246393.948466]
VI_after__Init : ['1.201', '0.1626', '1.800', '0.1930', '1.800', '0.0807', '7.000', '0.7077', 1, 1, 1, 1, 1724246402.305823]
VI_at__the_End : ['1.201', '0.4739', '1.800', '0.1378', '1.800', '0.1139', '7.000', '0.7084', 1, 1, 1, 1, 1724246461.5941763]