TEST_NAME : Wafer
TEST_DATE : 24_08_21-15_05_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-007-016-13 | FUSED_ID : 6359364768383398157
  IC_TEMP :  -67.32 | VDDM : 1117.67 | AUX_INT :    0.00 | CsaBias :   67.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36438e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.61187e-02
  ADC_P1  : 8.43918e-03 ± 4.20854e-04
  ADC_P2  : -5.99563e-06 ± 2.48987e-06
  CSA_Chi2/NDF : 1.48114e-04 / 2
  CSA_P0  : 5.80879e-02 ± 8.11748e-03
  CSA_P1  : 9.76763e-03 ± 6.11593e-04
  CSA_P2  : -5.36068e-05 ± 9.31384e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [13, 22, 27, 28, 44, 65, 78, 81, 84, 93, 96, 100, 103, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  20
 | P_BROKEN_FAST :  [2, 3, 10, 19, 21, 22, 31, 34, 36, 43, 47, 49, 50, 66, 78, 107, 111, 116, 118, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1450', '1.800', '0.1611', '1.800', '0.0847', '7.000', '0.7079', 1, 1, 1, 1, 1724245534.498614]
VI_after__Init : ['1.202', '0.1450', '1.800', '0.1606', '1.801', '0.0789', '7.000', '0.7076', 1, 1, 1, 1, 1724245542.7359543]
VI_at__the_End : ['1.201', '0.4554', '1.800', '0.1338', '1.806', '0.1174', '7.000', '0.7085', 1, 1, 1, 1, 1724245610.5675914]