TEST_NAME : Wafer
TEST_DATE : 24_08_21-15_00_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-007-019-13 | FUSED_ID : 6359364768383398205
  IC_TEMP :  -68.35 | VDDM : 1115.58 | AUX_INT :    0.00 | CsaBias :   67.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25470e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.50469e-02
  ADC_P1  : 8.53855e-03 ± 4.17380e-04
  ADC_P2  : -5.49649e-06 ± 2.54624e-06
  CSA_Chi2/NDF : 1.89063e-04 / 2
  CSA_P0  : 5.79455e-02 ± 9.17119e-03
  CSA_P1  : 1.04749e-02 ± 6.90983e-04
  CSA_P2  : -6.31712e-05 ± 1.05229e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [2, 5, 7, 23, 48, 53, 57, 68, 69, 71, 78, 79, 89, 100, 112, 120, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [45, 48, 54, 66, 75, 78, 80, 81, 94, 102, 114, 116, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2705', '1.800', '0.1321', '1.799', '0.0917', '7.000', '0.7079', 1, 1, 1, 1, 1724245246.9944332]
VI_after__Init : ['1.201', '0.2711', '1.800', '0.1321', '1.800', '0.0860', '7.000', '0.7076', 1, 1, 1, 1, 1724245255.7557282]
VI_at__the_End : ['1.201', '0.4624', '1.800', '0.1379', '1.799', '0.1181', '7.000', '0.7086', 1, 1, 1, 1, 1724245316.822795]