TEST_NAME : Wafer
TEST_DATE : 24_08_21-15_35_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-008-007-14 | FUSED_ID : 6359364768383402110
  IC_TEMP :  -70.67 | VDDM : 1116.32 | AUX_INT :    0.00 | CsaBias :   68.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.09883e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.23947e-02
  ADC_P1  : 8.66368e-03 ± 5.54133e-04
  ADC_P2  : -4.92849e-06 ± 3.49595e-06
  CSA_Chi2/NDF : 1.83263e-04 / 2
  CSA_P0  : 5.99939e-02 ± 9.02943e-03
  CSA_P1  : 1.06568e-02 ± 6.80302e-04
  CSA_P2  : -6.68214e-05 ± 1.03602e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [1, 11, 12, 27, 38, 44, 51, 55, 57, 62, 74, 77, 89, 91, 98, 100, 108, 122, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [17, 19, 35, 41, 47, 48, 84, 93, 95, 96, 100, 104, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4656', '1.800', '0.1398', '1.799', '0.1033', '7.000', '0.7076', 1, 1, 1, 1, 1724247349.9445817]
VI_after__Init : ['1.201', '0.4662', '1.800', '0.1400', '1.800', '0.0973', '7.000', '0.7078', 1, 1, 1, 1, 1724247357.98995]
VI_at__the_End : ['1.201', '0.4613', '1.800', '0.1415', '1.800', '0.1179', '7.000', '0.7083', 1, 1, 1, 1, 1724247426.2510602]