TEST_NAME : Wafer
TEST_DATE : 24_08_21-15_39_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-008-009-14 | FUSED_ID : 6359364768383402142
  IC_TEMP :  -57.98 | VDDM : 1120.66 | AUX_INT :    0.00 | CsaBias :   80.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15304e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.40109e-02
  ADC_P1  : 8.11568e-03 ± 3.96812e-04
  ADC_P2  : -3.98981e-06 ± 2.37096e-06
  CSA_Chi2/NDF : 1.76821e-04 / 2
  CSA_P0  : 6.17071e-02 ± 8.86930e-03
  CSA_P1  : 1.02073e-02 ± 6.68237e-04
  CSA_P2  : -5.67051e-05 ± 1.01765e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [1, 4, 6, 12, 22, 27, 47, 63, 80, 85, 86, 101, 114, 122, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [5, 8, 12, 29, 33, 37, 56, 85, 101, 109, 118, 119, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2592', '1.800', '0.1648', '1.799', '0.0969', '7.000', '0.7076', 1, 1, 1, 1, 1724247540.5318496]
VI_after__Init : ['1.201', '0.2593', '1.800', '0.1635', '1.801', '0.0912', '7.000', '0.7076', 1, 1, 1, 1, 1724247549.446104]
VI_at__the_End : ['1.201', '0.4774', '1.800', '0.1367', '1.802', '0.1153', '7.000', '0.7083', 1, 1, 1, 1, 1724247605.4371612]