TEST_NAME : Wafer
TEST_DATE : 24_08_21-15_45_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-008-013-14 | FUSED_ID : 6359364768383402206
  IC_TEMP :  -55.14 | VDDM : 1115.53 | AUX_INT :    0.00 | CsaBias :   78.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23483e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.48478e-02
  ADC_P1  : 7.89635e-03 ± 3.89924e-04
  ADC_P2  : -4.23790e-06 ± 2.23344e-06
  CSA_Chi2/NDF : 1.56166e-04 / 2
  CSA_P0  : 5.81640e-02 ± 8.33518e-03
  CSA_P1  : 1.01963e-02 ± 6.27996e-04
  CSA_P2  : -5.47502e-05 ± 9.56363e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [13, 28, 63, 88, 91, 102, 103, 111, 113, 119, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [7, 15, 24, 29, 39, 46, 51, 54, 56, 64, 67, 69, 77, 82, 88, 89, 93, 102, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1261', '1.800', '0.1311', '1.800', '0.0814', '7.000', '0.7077', 1, 1, 1, 1, 1724247923.7019122]
VI_after__Init : ['1.201', '0.1262', '1.800', '0.1305', '1.800', '0.0756', '7.000', '0.7076', 1, 1, 1, 1, 1724247931.7883017]
VI_at__the_End : ['1.201', '0.4807', '1.800', '0.1354', '1.800', '0.1120', '7.000', '0.7084', 1, 1, 1, 1, 1724247987.9750943]