TEST_NAME : Wafer
TEST_DATE : 24_08_21-15_59_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-008-022-09 | FUSED_ID : 6359364768383402345
  IC_TEMP :  -55.50 | VDDM : 1103.98 | AUX_INT :    0.00 | CsaBias :   73.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39701e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.64292e-02
  ADC_P1  : 8.24609e-03 ± 4.26224e-04
  ADC_P2  : -5.00686e-06 ± 2.51992e-06
  CSA_Chi2/NDF : 1.27004e-04 / 2
  CSA_P0  : 5.96555e-02 ± 7.51678e-03
  CSA_P1  : 9.81162e-03 ± 5.66335e-04
  CSA_P2  : -4.81961e-05 ± 8.62461e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [6, 26, 31, 40, 43, 48, 53, 59, 71, 83, 93, 95, 102, 115, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [2, 8, 19, 37, 40, 49, 63, 70, 75, 79, 80, 85, 90, 103, 106, 113, 116, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3057', '1.800', '0.1668', '1.800', '0.0849', '7.000', '0.7076', 1, 1, 1, 1, 1724248776.7277594]
VI_after__Init : ['1.201', '0.3058', '1.800', '0.1668', '1.801', '0.0793', '7.000', '0.7074', 1, 1, 1, 1, 1724248784.738039]
VI_at__the_End : ['1.201', '0.4825', '1.800', '0.1368', '1.804', '0.1125', '7.001', '0.7085', 1, 1, 1, 1, 1724248848.2783103]