TEST_NAME : Wafer
TEST_DATE : 24_08_21-16_48_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-009-002-03 | FUSED_ID : 6359364768383406115
  IC_TEMP :  -62.92 | VDDM : 1111.40 | AUX_INT :    0.00 | CsaBias :   67.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.86822e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.05632e-02
  ADC_P1  : 8.49449e-03 ± 5.03572e-04
  ADC_P2  : -5.39178e-06 ± 3.06069e-06
  CSA_Chi2/NDF : 1.86702e-04 / 2
  CSA_P0  : 5.87444e-02 ± 9.11374e-03
  CSA_P1  : 1.04908e-02 ± 6.86655e-04
  CSA_P2  : -6.02486e-05 ± 1.04569e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  21
 | N_BROKEN_FAST :  [0, 15, 17, 20, 24, 32, 36, 43, 44, 54, 64, 67, 74, 76, 77, 102, 111, 119, 122, 123, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [2, 22, 24, 26, 27, 31, 39, 76, 82, 106, 111, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2958', '1.800', '0.1647', '1.800', '0.1003', '7.000', '0.7088', 1, 1, 1, 1, 1724251738.2597907]
VI_after__Init : ['1.201', '0.2962', '1.800', '0.1648', '1.801', '0.0922', '7.000', '0.7079', 1, 1, 1, 1, 1724251746.2693112]
VI_at__the_End : ['1.201', '0.4765', '1.800', '0.1387', '1.804', '0.1149', '7.000', '0.7086', 1, 1, 1, 1, 1724251809.202334]