TEST_NAME : Wafer
TEST_DATE : 24_08_21-16_39_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-009-008-03 | FUSED_ID : 6359364768383406211
  IC_TEMP :  -62.19 | VDDM : 1126.47 | AUX_INT :    0.00 | CsaBias :   67.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40644e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.65183e-02
  ADC_P1  : 8.41984e-03 ± 4.34873e-04
  ADC_P2  : -5.46314e-06 ± 2.60865e-06
  CSA_Chi2/NDF : 1.85887e-04 / 2
  CSA_P0  : 5.80827e-02 ± 9.09382e-03
  CSA_P1  : 1.02118e-02 ± 6.85154e-04
  CSA_P2  : -5.65454e-05 ± 1.04341e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [11, 31, 80, 112, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [10, 11, 38, 42, 54, 67, 74, 103, 105, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2866', '1.800', '0.1606', '1.800', '0.0915', '7.000', '0.7076', 1, 1, 1, 1, 1724251164.91996]
VI_after__Init : ['1.201', '0.2865', '1.800', '0.1608', '1.800', '0.0856', '7.000', '0.7075', 1, 1, 1, 1, 1724251172.9032955]
VI_at__the_End : ['1.201', '0.4736', '1.800', '0.1369', '1.805', '0.1171', '7.000', '0.7084', 1, 1, 1, 1, 1724251235.952228]