TEST_NAME : Wafer
TEST_DATE : 24_08_21-16_37_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-009-009-03 | FUSED_ID : 6359364768383406227
  IC_TEMP :  -56.05 | VDDM : 1123.05 | AUX_INT :    0.00 | CsaBias :   81.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29037e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.54005e-02
  ADC_P1  : 8.18720e-03 ± 4.14599e-04
  ADC_P2  : -4.36197e-06 ± 2.47576e-06
  CSA_Chi2/NDF : 1.70413e-04 / 2
  CSA_P0  : 5.88761e-02 ± 8.70711e-03
  CSA_P1  : 1.03566e-02 ± 6.56018e-04
  CSA_P2  : -5.49432e-05 ± 9.99038e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [11, 19, 30, 32, 41, 42, 44, 48, 50, 51, 67, 80, 83, 84, 90, 92, 96, 97, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [4, 11, 23, 27, 43, 53, 55, 59, 91, 94, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4100', '1.800', '0.1475', '1.800', '0.0945', '7.001', '0.7074', 1, 1, 1, 1, 1724251069.6033149]
VI_after__Init : ['1.201', '0.4103', '1.800', '0.1476', '1.801', '0.0891', '7.000', '0.7076', 1, 1, 1, 1, 1724251077.759735]
VI_at__the_End : ['1.201', '0.4887', '1.800', '0.1398', '1.800', '0.1154', '7.001', '0.7083', 1, 1, 1, 1, 1724251141.1757612]