TEST_NAME : Wafer
TEST_DATE : 24_08_21-16_33_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-009-012-03 | FUSED_ID : 6359364768383406275
  IC_TEMP :  -60.25 | VDDM : 1122.66 | AUX_INT :    0.00 | CsaBias :   66.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00127e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.23749e-02
  ADC_P1  : 8.35036e-03 ± 3.60535e-04
  ADC_P2  : -5.77295e-06 ± 2.11807e-06
  CSA_Chi2/NDF : 1.65688e-04 / 2
  CSA_P0  : 6.05438e-02 ± 8.58553e-03
  CSA_P1  : 1.03347e-02 ± 6.46858e-04
  CSA_P2  : -5.69097e-05 ± 9.85088e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [26, 29, 49, 59, 61, 62, 64, 68, 69, 77, 94, 101, 106, 110, 114, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [11, 17, 26, 29, 40, 41, 68, 72, 83, 91, 96, 108, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3055', '1.800', '0.1684', '1.799', '0.0967', '7.000', '0.7079', 1, 1, 1, 1, 1724250782.4410055]
VI_after__Init : ['1.202', '0.3065', '1.800', '0.1686', '1.801', '0.0884', '7.000', '0.7072', 1, 1, 1, 1, 1724250790.6214936]
VI_at__the_End : ['1.201', '0.4799', '1.800', '0.1394', '1.801', '0.1169', '7.000', '0.7078', 1, 1, 1, 1, 1724250849.6547554]