TEST_NAME : Wafer
TEST_DATE : 24_08_21-16_31_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-009-013-03 | FUSED_ID : 6359364768383406291
  IC_TEMP :  -62.56 | VDDM : 1120.59 | AUX_INT :    0.00 | CsaBias :   83.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44499e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.68792e-02
  ADC_P1  : 8.42830e-03 ± 4.40792e-04
  ADC_P2  : -5.47803e-06 ± 2.64416e-06
  CSA_Chi2/NDF : 1.43334e-04 / 2
  CSA_P0  : 5.88241e-02 ± 7.98540e-03
  CSA_P1  : 9.68391e-03 ± 6.01642e-04
  CSA_P2  : -4.86776e-05 ± 9.16230e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [11, 28, 30, 36, 53, 57, 72, 85, 95, 103, 105, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [9, 26, 31, 33, 51, 54, 57, 85, 87, 90, 97, 98, 109, 119, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4260', '1.800', '0.1947', '1.800', '0.0985', '7.000', '0.7072', 1, 1, 1, 1, 1724250686.3096735]
VI_after__Init : ['1.201', '0.4268', '1.800', '0.1947', '1.802', '0.0933', '7.000', '0.7072', 1, 1, 1, 1, 1724250694.3500473]
VI_at__the_End : ['1.201', '0.4685', '1.800', '0.1384', '1.802', '0.1145', '7.000', '0.7078', 1, 1, 1, 1, 1724250755.3831143]