TEST_NAME : Wafer
TEST_DATE : 24_08_21-16_29_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-009-014-03 | FUSED_ID : 6359364768383406307
  IC_TEMP :  -55.27 | VDDM : 1127.41 | AUX_INT :    0.00 | CsaBias :   74.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05253e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.29405e-02
  ADC_P1  : 8.30164e-03 ± 3.78885e-04
  ADC_P2  : -4.93379e-06 ± 2.26579e-06
  CSA_Chi2/NDF : 1.34856e-04 / 2
  CSA_P0  : 5.90777e-02 ± 7.74563e-03
  CSA_P1  : 1.00733e-02 ± 5.83578e-04
  CSA_P2  : -5.23560e-05 ± 8.88720e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [15, 20, 41, 43, 53, 69, 80, 81, 82, 95, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [12, 13, 14, 38, 39, 44, 49, 81, 84, 90, 116, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.4753', '1.800', '0.1891', '1.800', '0.0937', '7.000', '0.7075', 1, 1, 1, 1, 1724250589.9572685]
VI_after__Init : ['1.201', '0.4764', '1.800', '0.1895', '1.800', '0.0861', '7.000', '0.7070', 1, 1, 1, 1, 1724250598.736541]
VI_at__the_End : ['1.201', '0.4817', '1.800', '0.1380', '1.804', '0.1111', '7.000', '0.7078', 1, 1, 1, 1, 1724250662.7964785]