TEST_NAME : Wafer
TEST_DATE : 24_08_21-16_23_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-009-018-04 | FUSED_ID : 6359364768383406372
  IC_TEMP :  -57.72 | VDDM : 1120.57 | AUX_INT :    0.00 | CsaBias :   74.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74623e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.95485e-02
  ADC_P1  : 8.34069e-03 ± 4.75704e-04
  ADC_P2  : -5.50369e-06 ± 2.81136e-06
  CSA_Chi2/NDF : 1.10828e-04 / 2
  CSA_P0  : 5.91120e-02 ± 7.02177e-03
  CSA_P1  : 9.47259e-03 ± 5.29040e-04
  CSA_P2  : -4.52670e-05 ± 8.05665e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [6, 11, 13, 20, 27, 33, 55, 57, 59, 60, 61, 80, 85, 91, 93, 108, 109, 111, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [0, 11, 17, 27, 44, 46, 70, 78, 93, 107, 110, 112, 122, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1834', '1.800', '0.1592', '1.800', '0.0879', '7.000', '0.7083', 1, 1, 1, 1, 1724250209.2092683]
VI_after__Init : ['1.201', '0.1834', '1.800', '0.1592', '1.801', '0.0807', '7.000', '0.7076', 1, 1, 1, 1, 1724250217.2985566]
VI_at__the_End : ['1.201', '0.4725', '1.800', '0.1364', '1.801', '0.1151', '7.000', '0.7082', 1, 1, 1, 1, 1724250280.9915586]