TEST_NAME : Wafer
TEST_DATE : 24_08_21-16_53_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-010-004-13 | FUSED_ID : 6359364768383410253
  IC_TEMP :  -61.12 | VDDM : 1109.38 | AUX_INT :    0.00 | CsaBias :   74.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.78475e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.98726e-02
  ADC_P1  : 8.27842e-03 ± 4.94039e-04
  ADC_P2  : -4.32759e-06 ± 2.99543e-06
  CSA_Chi2/NDF : 2.47334e-04 / 2
  CSA_P0  : 5.86827e-02 ± 1.04897e-02
  CSA_P1  : 1.03586e-02 ± 7.90325e-04
  CSA_P2  : -6.05758e-05 ± 1.20357e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [16, 25, 26, 32, 40, 43, 45, 51, 66, 73, 79, 80, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  21
 | P_BROKEN_FAST :  [9, 17, 19, 30, 38, 57, 60, 68, 69, 74, 77, 83, 88, 93, 95, 103, 109, 113, 118, 119, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3175', '1.800', '0.1321', '1.800', '0.0884', '7.001', '0.7072', 1, 1, 1, 1, 1724252024.9294689]
VI_after__Init : ['1.201', '0.3182', '1.800', '0.1321', '1.802', '0.0830', '7.000', '0.7075', 1, 1, 1, 1, 1724252032.9837801]
VI_at__the_End : ['1.201', '0.4714', '1.800', '0.1388', '1.801', '0.1152', '7.000', '0.7082', 1, 1, 1, 1, 1724252094.0359864]