TEST_NAME : Wafer
TEST_DATE : 24_08_21-16_56_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-010-006-13 | FUSED_ID : 6359364768383410285
  IC_TEMP :  -62.10 | VDDM : 1115.72 | AUX_INT :    0.00 | CsaBias :   74.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.86053e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.05002e-02
  ADC_P1  : 8.36154e-03 ± 4.89655e-04
  ADC_P2  : -5.55992e-06 ± 2.89855e-06
  CSA_Chi2/NDF : 1.97123e-04 / 2
  CSA_P0  : 5.89388e-02 ± 9.36463e-03
  CSA_P1  : 1.01551e-02 ± 7.05557e-04
  CSA_P2  : -5.59972e-05 ± 1.07448e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [2, 11, 21, 35, 61, 63, 88, 93, 107, 118, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [10, 28, 48, 50, 52, 59, 64, 81, 91, 94, 106, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3145', '1.800', '0.1686', '1.799', '0.0968', '7.000', '0.7073', 1, 1, 1, 1, 1724252215.9744694]
VI_after__Init : ['1.202', '0.3140', '1.800', '0.1688', '1.799', '0.0910', '7.000', '0.7072', 1, 1, 1, 1, 1724252224.7637298]
VI_at__the_End : ['1.201', '0.4736', '1.800', '0.1378', '1.803', '0.1170', '7.000', '0.7079', 1, 1, 1, 1, 1724252286.2159793]