TEST_NAME : Wafer
TEST_DATE : 24_08_21-17_00_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-010-008-13 | FUSED_ID : 6359364768383410317
  IC_TEMP :  -53.93 | VDDM : 1124.69 | AUX_INT :    0.00 | CsaBias :   73.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32933e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.57811e-02
  ADC_P1  : 8.24648e-03 ± 4.14989e-04
  ADC_P2  : -5.28631e-06 ± 2.43526e-06
  CSA_Chi2/NDF : 1.44541e-04 / 2
  CSA_P0  : 5.75854e-02 ± 8.01895e-03
  CSA_P1  : 9.98010e-03 ± 6.04170e-04
  CSA_P2  : -4.91278e-05 ± 9.20079e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [4, 7, 12, 20, 28, 36, 37, 43, 60, 67, 81, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [0, 2, 21, 23, 37, 74, 84, 89, 107, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3570', '1.800', '0.1610', '1.800', '0.0910', '7.000', '0.7069', 1, 1, 1, 1, 1724252407.4654775]
VI_after__Init : ['1.201', '0.3571', '1.800', '0.1610', '1.800', '0.0852', '7.000', '0.7072', 1, 1, 1, 1, 1724252415.634881]
VI_at__the_End : ['1.201', '0.4868', '1.800', '0.1397', '1.799', '0.1120', '7.001', '0.7078', 1, 1, 1, 1, 1724252476.5760212]