TEST_NAME : Wafer
TEST_DATE : 24_08_21-17_11_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-010-015-13 | FUSED_ID : 6359364768383410429
  IC_TEMP :  -59.14 | VDDM : 1125.27 | AUX_INT :    0.00 | CsaBias :   66.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29892e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.54845e-02
  ADC_P1  : 8.36020e-03 ± 4.23027e-04
  ADC_P2  : -4.79787e-06 ± 2.56339e-06
  CSA_Chi2/NDF : 1.37235e-04 / 2
  CSA_P0  : 5.95559e-02 ± 7.81368e-03
  CSA_P1  : 1.03485e-02 ± 5.88704e-04
  CSA_P2  : -5.84926e-05 ± 8.96527e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [14, 20, 28, 33, 46, 49, 55, 64, 65, 67, 75, 89, 96, 102, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [2, 16, 17, 20, 26, 30, 38, 39, 47, 63, 78, 85, 92, 96, 99, 115, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3320', '1.800', '0.1743', '1.800', '0.0908', '7.000', '0.7079', 1, 1, 1, 1, 1724253076.0008514]
VI_after__Init : ['1.201', '0.3320', '1.800', '0.1742', '1.801', '0.0850', '7.000', '0.7078', 1, 1, 1, 1, 1724253084.1762488]
VI_at__the_End : ['1.201', '0.4752', '1.800', '0.1361', '1.804', '0.1136', '7.000', '0.7085', 1, 1, 1, 1, 1724253149.1914337]