TEST_NAME : Wafer
TEST_DATE : 24_08_21-17_12_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-010-016-10 | FUSED_ID : 6359364768383410442
  IC_TEMP :  -62.35 | VDDM : 1118.07 | AUX_INT :    0.00 | CsaBias :   67.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51338e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.75080e-02
  ADC_P1  : 8.46022e-03 ± 4.47785e-04
  ADC_P2  : -5.81144e-06 ± 2.67485e-06
  CSA_Chi2/NDF : 1.49637e-04 / 2
  CSA_P0  : 5.95738e-02 ± 8.15908e-03
  CSA_P1  : 1.02515e-02 ± 6.14728e-04
  CSA_P2  : -5.72170e-05 ± 9.36158e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [12, 29, 38, 41, 42, 45, 46, 49, 64, 73, 75, 105, 117, 126, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [4, 19, 36, 44, 45, 53, 63, 65, 67, 70, 72, 77, 100, 103, 106, 107, 110, 120, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3399', '1.800', '0.1495', '1.799', '0.0967', '7.000', '0.7078', 1, 1, 1, 1, 1724253171.120724]
VI_after__Init : ['1.201', '0.3400', '1.800', '0.1495', '1.800', '0.0915', '7.001', '0.7079', 1, 1, 1, 1, 1724253179.2271392]
VI_at__the_End : ['1.201', '0.4741', '1.800', '0.1375', '1.801', '0.1143', '7.000', '0.7084', 1, 1, 1, 1, 1724253243.0533924]