TEST_NAME : Wafer
TEST_DATE : 24_08_21-17_14_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-010-017-10 | FUSED_ID : 6359364768383410458
  IC_TEMP :  -60.30 | VDDM : 1112.86 | AUX_INT :    0.00 | CsaBias :   72.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.92226e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.10021e-02
  ADC_P1  : 8.05343e-03 ± 4.85701e-04
  ADC_P2  : -4.81587e-06 ± 2.80027e-06
  CSA_Chi2/NDF : 1.58674e-04 / 2
  CSA_P0  : 5.94910e-02 ± 8.40186e-03
  CSA_P1  : 1.01194e-02 ± 6.33019e-04
  CSA_P2  : -5.50958e-05 ± 9.64014e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [4, 13, 35, 49, 50, 52, 66, 67, 79, 93, 102, 104, 105, 109, 113, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [6, 28, 35, 41, 50, 60, 61, 63, 77, 103, 104, 107, 111, 112, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3421', '1.800', '0.1247', '1.800', '0.0943', '7.000', '0.7075', 1, 1, 1, 1, 1724253266.000658]
VI_after__Init : ['1.201', '0.3423', '1.800', '0.1248', '1.800', '0.0889', '7.000', '0.7076', 1, 1, 1, 1, 1724253274.2859602]
VI_at__the_End : ['1.201', '0.4739', '1.800', '0.1349', '1.799', '0.1127', '7.000', '0.7083', 1, 1, 1, 1, 1724253334.2694302]