TEST_NAME : Wafer
TEST_DATE : 24_08_21-17_22_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-010-022-10 | FUSED_ID : 6359364768383410538
  IC_TEMP :  -60.12 | VDDM : 1119.94 | AUX_INT :    0.00 | CsaBias :   72.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.78790e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.98990e-02
  ADC_P1  : 8.15144e-03 ± 4.81730e-04
  ADC_P2  : -4.56797e-06 ± 2.84491e-06
  CSA_Chi2/NDF : 1.90007e-04 / 2
  CSA_P0  : 5.78844e-02 ± 9.19405e-03
  CSA_P1  : 1.03640e-02 ± 6.92706e-04
  CSA_P2  : -5.69298e-05 ± 1.05491e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [1, 10, 20, 40, 42, 45, 46, 50, 71, 74, 75, 87, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [19, 35, 44, 45, 47, 51, 52, 62, 70, 72, 79, 109, 110, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2869', '1.800', '0.1310', '1.799', '0.0864', '7.000', '0.7072', 1, 1, 1, 1, 1724253743.3911614]
VI_after__Init : ['1.201', '0.2870', '1.800', '0.1311', '1.800', '0.0806', '7.000', '0.7073', 1, 1, 1, 1, 1724253751.5315692]
VI_at__the_End : ['1.201', '0.4808', '1.800', '0.1386', '1.803', '0.1132', '7.000', '0.7081', 1, 1, 1, 1, 1724253811.228994]