TEST_NAME : Wafer
TEST_DATE : 24_08_21-18_05_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-011-006-00 | FUSED_ID : 6359364768383414368
  IC_TEMP :  -60.20 | VDDM : 1118.64 | AUX_INT :    0.00 | CsaBias :   59.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24705e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.49705e-02
  ADC_P1  : 8.55583e-03 ± 4.14150e-04
  ADC_P2  : -5.80067e-06 ± 2.51150e-06
  CSA_Chi2/NDF : 2.02863e-04 / 2
  CSA_P0  : 5.93019e-02 ± 9.50000e-03
  CSA_P1  : 1.04486e-02 ± 7.15756e-04
  CSA_P2  : -5.68954e-05 ± 1.09001e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [12, 18, 21, 48, 50, 78, 85, 89, 95, 96, 98, 100, 124, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [0, 13, 18, 30, 40, 42, 49, 61, 101, 103, 106, 111, 113, 114, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3437', '1.800', '0.1521', '1.799', '0.0922', '7.000', '0.7084', 1, 1, 1, 1, 1724256321.5304692]
VI_after__Init : ['1.201', '0.3438', '1.800', '0.1522', '1.801', '0.0851', '7.000', '0.7079', 1, 1, 1, 1, 1724256330.3878644]
VI_at__the_End : ['1.201', '0.4879', '1.800', '0.1437', '1.807', '0.1142', '7.000', '0.7085', 1, 1, 1, 1, 1724256390.6443331]