TEST_NAME : Wafer
TEST_DATE : 24_08_21-18_02_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-011-008-00 | FUSED_ID : 6359364768383414400
  IC_TEMP :  -64.97 | VDDM : 1117.52 | AUX_INT :    0.00 | CsaBias :   67.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.82430e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.02019e-02
  ADC_P1  : 8.52687e-03 ± 4.93056e-04
  ADC_P2  : -5.97681e-06 ± 2.96145e-06
  CSA_Chi2/NDF : 1.93982e-04 / 2
  CSA_P0  : 5.78972e-02 ± 9.28974e-03
  CSA_P1  : 1.04052e-02 ± 6.99915e-04
  CSA_P2  : -6.06259e-05 ± 1.06589e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [31, 32, 37, 42, 50, 57, 59, 65, 66, 87, 104, 105, 116, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [2, 11, 23, 33, 34, 35, 43, 44, 50, 77, 80, 81, 90, 111, 115, 116, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2411', '1.800', '0.1575', '1.800', '0.0927', '7.000', '0.7079', 1, 1, 1, 1, 1724256131.377945]
VI_after__Init : ['1.201', '0.2411', '1.800', '0.1576', '1.801', '0.0868', '7.000', '0.7076', 1, 1, 1, 1, 1724256139.5912592]
VI_at__the_End : ['1.201', '0.4669', '1.800', '0.1380', '1.804', '0.1165', '7.000', '0.7085', 1, 1, 1, 1, 1724256201.929584]