TEST_NAME : Wafer
TEST_DATE : 24_08_21-18_00_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-011-009-00 | FUSED_ID : 6359364768383414416
  IC_TEMP :  -56.84 | VDDM : 1123.37 | AUX_INT :    0.00 | CsaBias :   72.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49907e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.73776e-02
  ADC_P1  : 8.10755e-03 ± 4.37843e-04
  ADC_P2  : -4.71667e-06 ± 2.55704e-06
  CSA_Chi2/NDF : 1.53172e-04 / 2
  CSA_P0  : 5.95113e-02 ± 8.25491e-03
  CSA_P1  : 9.85039e-03 ± 6.21948e-04
  CSA_P2  : -4.88374e-05 ± 9.47153e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [9, 12, 17, 20, 40, 42, 47, 49, 54, 63, 66, 79, 82, 91, 110, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [4, 34, 41, 62, 76, 79, 80, 84, 86, 106, 113, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2672', '1.800', '0.1571', '1.799', '0.0913', '7.000', '0.7075', 1, 1, 1, 1, 1724256035.90906]
VI_after__Init : ['1.201', '0.2677', '1.800', '0.1572', '1.800', '0.0856', '7.000', '0.7073', 1, 1, 1, 1, 1724256043.97344]
VI_at__the_End : ['1.201', '0.4808', '1.800', '0.1380', '1.805', '0.1138', '7.000', '0.7083', 1, 1, 1, 1, 1724256104.2759514]