TEST_NAME : Wafer
TEST_DATE : 24_08_21-17_59_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-011-010-00 | FUSED_ID : 6359364768383414432
  IC_TEMP :  -67.22 | VDDM : 1119.46 | AUX_INT :    0.00 | CsaBias :   74.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58002e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.81071e-02
  ADC_P1  : 8.27681e-03 ± 4.52021e-04
  ADC_P2  : -5.12536e-06 ± 2.67680e-06
  CSA_Chi2/NDF : 1.71799e-04 / 2
  CSA_P0  : 6.01676e-02 ± 8.74243e-03
  CSA_P1  : 1.07708e-02 ± 6.58679e-04
  CSA_P2  : -6.56808e-05 ± 1.00309e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [1, 5, 7, 19, 27, 28, 30, 44, 56, 91, 92, 96, 106, 111, 113, 114, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [11, 15, 18, 26, 45, 50, 62, 89, 103, 111, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1560', '1.800', '0.1366', '1.800', '0.0887', '7.000', '0.7073', 1, 1, 1, 1, 1724255940.6152947]
VI_after__Init : ['1.201', '0.1560', '1.800', '0.1366', '1.799', '0.0838', '7.000', '0.7072', 1, 1, 1, 1, 1724255948.7436717]
VI_at__the_End : ['1.201', '0.4697', '1.800', '0.1384', '1.808', '0.1165', '7.000', '0.7081', 1, 1, 1, 1, 1724256013.4838455]