TEST_NAME : Wafer
TEST_DATE : 24_08_21-17_57_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-011-011-00 | FUSED_ID : 6359364768383414448
  IC_TEMP :  -70.57 | VDDM : 1120.53 | AUX_INT :    0.00 | CsaBias :   60.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23060e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.48052e-02
  ADC_P1  : 8.73060e-03 ± 4.18565e-04
  ADC_P2  : -6.25666e-06 ± 2.57635e-06
  CSA_Chi2/NDF : 1.69126e-04 / 2
  CSA_P0  : 6.11198e-02 ± 8.67415e-03
  CSA_P1  : 1.00372e-02 ± 6.53535e-04
  CSA_P2  : -5.77808e-05 ± 9.95256e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [3, 8, 13, 15, 22, 30, 38, 47, 51, 79, 86, 92, 117, 123, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [1, 15, 25, 35, 36, 42, 50, 84, 91, 101, 102, 110, 116, 117, 118, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2332', '1.800', '0.1548', '1.799', '0.0886', '7.000', '0.7075', 1, 1, 1, 1, 1724255844.6294825]
VI_after__Init : ['1.201', '0.2333', '1.800', '0.1549', '1.802', '0.0828', '7.000', '0.7076', 1, 1, 1, 1, 1724255853.4688923]
VI_at__the_End : ['1.201', '0.4613', '1.800', '0.1394', '1.800', '0.1166', '7.000', '0.7081', 1, 1, 1, 1, 1724255916.2521234]