TEST_NAME : Wafer
TEST_DATE : 24_08_21-17_47_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-011-017-07 | FUSED_ID : 6359364768383414551
  IC_TEMP :  -68.86 | VDDM : 1109.77 | AUX_INT :    0.00 | CsaBias :   65.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.86409e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.05294e-02
  ADC_P1  : 8.21258e-03 ± 4.79993e-04
  ADC_P2  : -5.42753e-06 ± 2.78493e-06
  CSA_Chi2/NDF : 1.62221e-04 / 2
  CSA_P0  : 5.96305e-02 ± 8.49525e-03
  CSA_P1  : 9.67899e-03 ± 6.40056e-04
  CSA_P2  : -5.41259e-05 ± 9.74729e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [20, 22, 26, 32, 45, 46, 51, 52, 82, 96, 98, 103, 110, 114, 121, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [0, 17, 22, 24, 26, 30, 38, 39, 41, 66, 69, 72, 100, 103, 118]
 | P_BROKEN_SLOW :  [87]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1969', '1.800', '0.1742', '1.799', '0.0868', '7.000', '0.7074', 1, 1, 1, 1, 1724255270.1139026]
VI_after__Init : ['1.201', '0.1941', '1.800', '0.1747', '1.800', '0.0814', '7.000', '0.7071', 1, 1, 1, 1, 1724255278.824393]
VI_at__the_End : ['1.201', '0.4500', '1.800', '0.1356', '1.803', '0.1172', '7.000', '0.7079', 1, 1, 1, 1, 1724255340.9458482]