TEST_NAME : Wafer
TEST_DATE : 24_08_21-17_41_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-011-021-07 | FUSED_ID : 6359364768383414615
  IC_TEMP :  -54.16 | VDDM : 1125.28 | AUX_INT :    0.00 | CsaBias :   81.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36015e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.60782e-02
  ADC_P1  : 8.25170e-03 ± 4.19772e-04
  ADC_P2  : -5.29470e-06 ± 2.46333e-06
  CSA_Chi2/NDF : 1.89011e-04 / 2
  CSA_P0  : 5.81241e-02 ± 9.16994e-03
  CSA_P1  : 1.05055e-02 ± 6.90889e-04
  CSA_P2  : -5.54339e-05 ± 1.05214e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [24, 28, 33, 50, 56, 65, 72, 75, 84, 99, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  20
 | P_BROKEN_FAST :  [5, 6, 12, 16, 22, 23, 29, 30, 42, 43, 47, 52, 58, 63, 77, 79, 84, 90, 100, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2981', '1.800', '0.1523', '1.799', '0.0870', '6.997', '0.7079', 1, 1, 1, 1, 1724254887.5160072]
VI_after__Init : ['1.201', '0.2982', '1.799', '0.1523', '1.800', '0.0817', '7.001', '0.7071', 1, 1, 1, 1, 1724254896.2725112]
VI_at__the_End : ['1.201', '0.4980', '1.800', '0.1391', '1.806', '0.1127', '7.000', '0.7078', 1, 1, 1, 1, 1724254957.0341656]