TEST_NAME : Wafer
TEST_DATE : 24_08_21-18_13_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-012-002-08 | FUSED_ID : 6359364768383418408
  IC_TEMP :  -65.15 | VDDM : 1118.54 | AUX_INT :    0.00 | CsaBias :   68.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.72285e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.93500e-02
  ADC_P1  : 8.64585e-03 ± 4.93348e-04
  ADC_P2  : -5.76141e-06 ± 3.03844e-06
  CSA_Chi2/NDF : 2.02278e-04 / 2
  CSA_P0  : 5.87205e-02 ± 9.48629e-03
  CSA_P1  : 1.04608e-02 ± 7.14724e-04
  CSA_P2  : -5.86613e-05 ± 1.08844e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [5, 7, 19, 21, 27, 47, 59, 68, 71, 74, 83, 84, 91, 100, 117, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [6, 26, 27, 30, 32, 39, 40, 54, 57, 58, 66, 68, 72, 75, 87, 88, 104, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2503', '1.800', '0.1582', '1.799', '0.0903', '7.000', '0.7079', 1, 1, 1, 1, 1724256800.5530798]
VI_after__Init : ['1.201', '0.2504', '1.800', '0.1584', '1.800', '0.0844', '7.000', '0.7075', 1, 1, 1, 1, 1724256809.4564629]
VI_at__the_End : ['1.201', '0.4800', '1.800', '0.1393', '1.804', '0.1147', '7.000', '0.7083', 1, 1, 1, 1, 1724256871.9531505]