TEST_NAME : Wafer
TEST_DATE : 24_08_21-18_22_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-012-008-08 | FUSED_ID : 6359364768383418504
  IC_TEMP :  -58.98 | VDDM : 1126.70 | AUX_INT :    0.00 | CsaBias :   67.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07348e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.31676e-02
  ADC_P1  : 8.45176e-03 ± 3.91076e-04
  ADC_P2  : -5.03181e-06 ± 2.38743e-06
  CSA_Chi2/NDF : 1.38571e-04 / 2
  CSA_P0  : 5.81210e-02 ± 7.85160e-03
  CSA_P1  : 9.76337e-03 ± 5.91562e-04
  CSA_P2  : -5.10368e-05 ± 9.00878e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [40, 50, 60, 61, 65, 74, 85, 86, 94, 97, 108, 110, 113, 123, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [10, 12, 18, 36, 44, 45, 50, 65, 86, 88, 109, 115, 119, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3474', '1.800', '0.1453', '1.799', '0.0935', '7.000', '0.7072', 1, 1, 1, 1, 1724257371.8030627]
VI_after__Init : ['1.201', '0.3479', '1.800', '0.1454', '1.800', '0.0877', '7.000', '0.7071', 1, 1, 1, 1, 1724257379.9154766]
VI_at__the_End : ['1.201', '0.4671', '1.800', '0.1373', '1.803', '0.1144', '7.000', '0.7080', 1, 1, 1, 1, 1724257444.59319]