TEST_NAME : Wafer
TEST_DATE : 24_08_21-18_35_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-012-016-15 | FUSED_ID : 6359364768383418639
  IC_TEMP :  -60.93 | VDDM : 1119.65 | AUX_INT :    0.00 | CsaBias :   66.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.70371e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.91865e-02
  ADC_P1  : 8.33232e-03 ± 4.69877e-04
  ADC_P2  : -5.48909e-06 ± 2.77692e-06
  CSA_Chi2/NDF : 1.43123e-04 / 2
  CSA_P0  : 6.08278e-02 ± 7.97953e-03
  CSA_P1  : 1.05225e-02 ± 6.01200e-04
  CSA_P2  : -5.94629e-05 ± 9.15556e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [15, 20, 21, 33, 53, 55, 78, 100, 110, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [1, 50, 58, 59, 60, 78, 88, 90, 94, 100, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2903', '1.800', '0.1290', '1.799', '0.0953', '7.000', '0.7074', 1, 1, 1, 1, 1724258137.5695193]
VI_after__Init : ['1.201', '0.2901', '1.800', '0.1290', '1.801', '0.0895', '7.000', '0.7075', 1, 1, 1, 1, 1724258145.7850082]
VI_at__the_End : ['1.201', '0.4836', '1.800', '0.1394', '1.806', '0.1146', '7.000', '0.7083', 1, 1, 1, 1, 1724258204.1533217]