TEST_NAME : Wafer
TEST_DATE : 24_08_21-18_41_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-012-020-15 | FUSED_ID : 6359364768383418703
  IC_TEMP :  -72.34 | VDDM : 1102.53 | AUX_INT :    0.00 | CsaBias :   76.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.95027e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.12272e-02
  ADC_P1  : 8.56719e-03 ± 5.06043e-04
  ADC_P2  : -6.32474e-06 ± 3.02658e-06
  CSA_Chi2/NDF : 1.72742e-04 / 2
  CSA_P0  : 6.02171e-02 ± 8.76639e-03
  CSA_P1  : 1.04050e-02 ± 6.60484e-04
  CSA_P2  : -6.26883e-05 ± 1.00584e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [0, 1, 8, 38, 59, 71, 83, 87, 89, 98, 111, 115, 117, 121, 123, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [13, 15, 17, 24, 39, 50, 56, 64, 67, 68, 73, 83, 101, 108, 114, 116, 122, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3473', '1.800', '0.1432', '1.800', '0.0956', '7.000', '0.7076', 1, 1, 1, 1, 1724258519.5497324]
VI_after__Init : ['1.200', '0.3470', '1.800', '0.1431', '1.800', '0.0898', '7.000', '0.7076', 1, 1, 1, 1, 1724258527.757999]
VI_at__the_End : ['1.201', '0.4622', '1.800', '0.1370', '1.799', '0.1155', '7.000', '0.7084', 1, 1, 1, 1, 1724258591.9680562]