TEST_NAME : Wafer
TEST_DATE : 24_08_21-19_28_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-013-005-05 | FUSED_ID : 6359364768383422549
  IC_TEMP :  -51.48 | VDDM : 1115.83 | AUX_INT :    0.00 | CsaBias :   80.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.98067e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.14696e-02
  ADC_P1  : 8.13066e-03 ± 5.15847e-04
  ADC_P2  : -3.99523e-06 ± 3.08838e-06
  CSA_Chi2/NDF : 1.70942e-04 / 2
  CSA_P0  : 6.04255e-02 ± 8.72061e-03
  CSA_P1  : 1.00993e-02 ± 6.57035e-04
  CSA_P2  : -5.02612e-05 ± 1.00059e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [14, 35, 37, 53, 73, 80, 92, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [1, 5, 17, 21, 25, 45, 50, 53, 54, 66, 75, 78, 85, 125, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2200', '1.800', '0.1354', '1.799', '0.0837', '7.001', '0.7078', 1, 1, 1, 1, 1724261287.9506614]
VI_after__Init : ['1.201', '0.2200', '1.800', '0.1347', '1.801', '0.0779', '7.000', '0.7077', 1, 1, 1, 1, 1724261296.0910573]
VI_at__the_End : ['1.201', '0.4902', '1.800', '0.1402', '1.799', '0.1114', '7.000', '0.7084', 1, 1, 1, 1, 1724261356.7896285]