TEST_NAME : Wafer
TEST_DATE : 24_08_21-19_45_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-014-011-11 | FUSED_ID : 6359364768383426747
  IC_TEMP :  -55.54 | VDDM : 1111.47 | AUX_INT :    0.00 | CsaBias :   80.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.56263e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.79521e-02
  ADC_P1  : 8.11131e-03 ± 4.46120e-04
  ADC_P2  : -4.97067e-06 ± 2.58609e-06
  CSA_Chi2/NDF : 1.41446e-04 / 2
  CSA_P0  : 5.98173e-02 ± 7.93265e-03
  CSA_P1  : 1.00620e-02 ± 5.97668e-04
  CSA_P2  : -4.98928e-05 ± 9.10178e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [9, 10, 11, 18, 26, 51, 61, 62, 65, 67, 79, 82, 83, 100, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [11, 13, 15, 17, 28, 50, 58, 62, 75, 76, 92, 100, 115, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2409', '1.800', '0.1872', '1.799', '0.0942', '7.000', '0.7071', 1, 1, 1, 1, 1724262339.5352545]
VI_after__Init : ['1.201', '0.2411', '1.800', '0.1872', '1.800', '0.0890', '7.000', '0.7072', 1, 1, 1, 1, 1724262348.2785733]
VI_at__the_End : ['1.201', '0.4876', '1.800', '0.1385', '1.799', '0.1111', '7.000', '0.7078', 1, 1, 1, 1, 1724262408.843043]