TEST_NAME : Wafer
TEST_DATE : 24_08_21-19_56_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-014-018-12 | FUSED_ID : 6359364768383426860
  IC_TEMP :  -51.14 | VDDM : 1112.80 | AUX_INT :    0.00 | CsaBias :   85.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.32275e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.40790e-02
  ADC_P1  : 7.79437e-03 ± 5.24964e-04
  ADC_P2  : -3.96765e-06 ± 2.98156e-06
  CSA_Chi2/NDF : 1.30314e-04 / 2
  CSA_P0  : 5.98047e-02 ± 7.61407e-03
  CSA_P1  : 9.84813e-03 ± 5.73665e-04
  CSA_P2  : -4.74217e-05 ± 8.73625e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [1, 11, 20, 33, 45, 55, 63, 81, 82, 96, 100, 103, 113, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [21, 32, 43, 45, 48, 49, 57, 88, 103, 106, 111, 112, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2593', '1.800', '0.1586', '1.800', '0.0884', '7.000', '0.7072', 1, 1, 1, 1, 1724263008.494771]
VI_after__Init : ['1.202', '0.2595', '1.800', '0.1587', '1.801', '0.0826', '7.000', '0.7074', 1, 1, 1, 1, 1724263016.8010085]
VI_at__the_End : ['1.201', '0.4881', '1.800', '0.1359', '1.801', '0.1129', '7.000', '0.7077', 1, 1, 1, 1, 1724263078.590967]