TEST_NAME : Wafer
TEST_DATE : 24_08_21-20_07_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-014-025-12 | FUSED_ID : 6359364768383426972
  IC_TEMP :  -43.83 | VDDM : 1110.19 | AUX_INT :    0.00 | CsaBias :   75.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.90473e-03 / 2
  ADC_P0  : 0.00000e+00 ± 7.03730e-02
  ADC_P1  : 7.59405e-03 ± 1.06173e-03
  ADC_P2  : -2.78421e-06 ± 6.04779e-06
  CSA_Chi2/NDF : 9.60381e-05 / 2
  CSA_P0  : 5.65475e-02 ± 6.53648e-03
  CSA_P1  : 9.50305e-03 ± 4.92477e-04
  CSA_P2  : -4.16950e-05 ± 7.49984e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [19, 36, 40, 51, 53, 63, 66, 75, 78, 88, 103, 112, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [12, 43, 58, 63, 68, 77, 97, 103, 107, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2834', '1.800', '0.1211', '1.800', '0.0931', '7.000', '0.7073', 1, 1, 1, 1, 1724263675.518358]
VI_after__Init : ['1.202', '0.2834', '1.800', '0.1211', '1.799', '0.0877', '7.000', '0.7074', 1, 1, 1, 1, 1724263683.8047683]
VI_at__the_End : ['1.201', '0.4863', '1.800', '0.1318', '1.803', '0.1111', '7.000', '0.7083', 1, 1, 1, 1, 1724263747.898443]