TEST_NAME : Wafer
TEST_DATE : 24_08_21-20_39_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-015-007-06 | FUSED_ID : 6359364768383430774
  IC_TEMP :  -59.73 | VDDM : 1122.48 | AUX_INT :    0.00 | CsaBias :   83.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54726e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.78142e-02
  ADC_P1  : 8.44926e-03 ± 4.54851e-04
  ADC_P2  : -5.53300e-06 ± 2.73308e-06
  CSA_Chi2/NDF : 2.02320e-04 / 2
  CSA_P0  : 5.58671e-02 ± 9.48727e-03
  CSA_P1  : 1.04365e-02 ± 7.14797e-04
  CSA_P2  : -5.70550e-05 ± 1.08855e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [7, 16, 22, 23, 26, 30, 35, 37, 41, 44, 58, 62, 75, 92, 93, 106, 108, 112, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [12, 16, 18, 20, 22, 29, 31, 37, 45, 46, 55, 77, 78, 95, 97, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2107', '1.800', '0.1512', '1.800', '0.0828', '7.000', '0.7072', 1, 1, 1, 1, 1724265582.9129364]
VI_after__Init : ['1.202', '0.2108', '1.800', '0.1512', '1.800', '0.0774', '7.000', '0.7073', 1, 1, 1, 1, 1724265590.9733417]
VI_at__the_End : ['1.201', '0.4838', '1.800', '0.1355', '1.799', '0.1136', '7.000', '0.7079', 1, 1, 1, 1, 1724265657.8144398]