TEST_NAME : Wafer
TEST_DATE : 24_08_21-20_30_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x5 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-015-013-06 | FUSED_ID : 6359364768383430870
  IC_TEMP :  -56.19 | VDDM : 1118.15 | AUX_INT :    0.00 | CsaBias :   86.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.12492e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.25954e-02
  ADC_P1  : 7.92034e-03 ± 5.07503e-04
  ADC_P2  : -4.28326e-06 ± 2.91218e-06
  CSA_Chi2/NDF : 1.47975e-04 / 2
  CSA_P0  : 5.95771e-02 ± 8.11367e-03
  CSA_P1  : 1.00237e-02 ± 6.11306e-04
  CSA_P2  : -5.19203e-05 ± 9.30947e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [11, 14, 16, 32, 34, 40, 43, 50, 55, 71, 72, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [9, 91, 105, 115, 119, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2233', '1.800', '0.1671', '1.800', '0.0910', '7.000', '0.7079', 1, 1, 1, 1, 1724265011.067652]
VI_after__Init : ['1.201', '0.2235', '1.800', '0.1672', '1.801', '0.0852', '7.000', '0.7080', 1, 1, 1, 1, 1724265019.1361687]
VI_at__the_End : ['1.201', '0.4829', '1.800', '0.1333', '1.807', '0.1124', '7.000', '0.7087', 1, 1, 1, 1, 1724265080.0663023]