TEST_NAME : Wafer
TEST_DATE : 24_08_21-20_19_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-015-020-01 | FUSED_ID : 6359364768383430977
  IC_TEMP :  -53.74 | VDDM : 1134.33 | AUX_INT :    0.00 | CsaBias :   84.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.19009e-04 / 2
  ADC_P0  : 0.00000e+00 ± 2.14361e-02
  ADC_P1  : 8.45324e-03 ± 3.57182e-04
  ADC_P2  : -5.33010e-06 ± 2.16315e-06
  CSA_Chi2/NDF : 1.19569e-04 / 2
  CSA_P0  : 6.02583e-02 ± 7.29344e-03
  CSA_P1  : 9.84764e-03 ± 5.49508e-04
  CSA_P2  : -4.53020e-05 ± 8.36835e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [6, 10, 14, 16, 24, 46, 55, 58, 60, 61, 68, 77, 80, 89, 119, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [0, 35, 36, 49, 78, 86, 87, 100, 107, 112, 118, 120, 122, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3151', '1.800', '0.1519', '1.800', '0.0927', '7.001', '0.7086', 1, 1, 1, 1, 1724264342.3334188]
VI_after__Init : ['1.201', '0.3152', '1.800', '0.1519', '1.800', '0.0852', '7.000', '0.7079', 1, 1, 1, 1, 1724264350.3498294]
VI_at__the_End : ['1.201', '0.4969', '1.800', '0.1398', '1.799', '0.1101', '7.000', '0.7086', 1, 1, 1, 1, 1724264412.28987]