TEST_NAME : Wafer
TEST_DATE : 24_08_21-21_11_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-016-022-09 | FUSED_ID : 6359364768383435113
  IC_TEMP :  -55.75 | VDDM : 1115.21 | AUX_INT :    0.00 | CsaBias :   79.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.54045e-03 / 2
  ADC_P0  : 0.00000e+00 ± 4.20741e-02
  ADC_P1  : 7.94343e-03 ± 6.63865e-04
  ADC_P2  : -3.99011e-06 ± 3.85957e-06
  CSA_Chi2/NDF : 1.77589e-04 / 2
  CSA_P0  : 5.87683e-02 ± 8.88854e-03
  CSA_P1  : 1.00343e-02 ± 6.69687e-04
  CSA_P2  : -4.99918e-05 ± 1.01985e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [18, 42, 52, 53, 55, 66, 69, 74, 81, 86, 93, 95, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [47, 49, 58, 64, 70, 81, 92, 107, 111, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2457', '1.800', '0.1549', '1.800', '0.0859', '7.000', '0.7072', 1, 1, 1, 1, 1724267481.5686748]
VI_after__Init : ['1.201', '0.2459', '1.800', '0.1549', '1.800', '0.0802', '7.000', '0.7069', 1, 1, 1, 1, 1724267490.2908938]
VI_at__the_End : ['1.201', '0.4881', '1.800', '0.1366', '1.799', '0.1114', '7.001', '0.7080', 1, 1, 1, 1, 1724267556.7934678]