TEST_NAME : Wafer
TEST_DATE : 24_08_21-21_20_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-017-018-04 | FUSED_ID : 6359364768383439140
  IC_TEMP :  -54.81 | VDDM : 1119.01 | AUX_INT :    0.00 | CsaBias :   88.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46168e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.70340e-02
  ADC_P1  : 7.38178e-03 ± 4.02782e-04
  ADC_P2  : -3.40585e-06 ± 2.18153e-06
  CSA_Chi2/NDF : 1.26170e-04 / 2
  CSA_P0  : 5.61866e-02 ± 7.49203e-03
  CSA_P1  : 9.47785e-03 ± 5.64471e-04
  CSA_P2  : -4.28454e-05 ± 8.59622e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [15, 27, 50, 55, 66, 73, 81, 83, 87, 94, 111, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [19, 45, 47, 51, 60, 68, 74, 81, 92, 101, 103, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2361', '1.800', '0.1595', '1.800', '0.0843', '7.000', '0.7076', 1, 1, 1, 1, 1724268049.504288]
VI_after__Init : ['1.201', '0.2361', '1.800', '0.1595', '1.802', '0.0786', '7.000', '0.7076', 1, 1, 1, 1, 1724268058.4785695]
VI_at__the_End : ['1.201', '0.4793', '1.800', '0.1322', '1.799', '0.1126', '7.000', '0.7081', 1, 1, 1, 1, 1724268116.74604]