TEST_NAME : Wafer
TEST_DATE : 24_08_22-09_58_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-003-013-04 | FUSED_ID : 6359364768384430292
  IC_TEMP :  -85.50 | VDDM : 1111.47 | AUX_INT :  -14.35 | CsaBias :   48.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.10557e-03 / 2
  ADC_P0  : -1.43502e-02 ± 3.78626e-02
  ADC_P1  : 8.98670e-03 ± 9.64293e-04
  ADC_P2  : -6.75076e-06 ± 4.96276e-06
  CSA_Chi2/NDF : 1.49885e-04 / 2
  CSA_P0  : 5.83568e-02 ± 8.16585e-03
  CSA_P1  : 1.04408e-02 ± 6.15238e-04
  CSA_P2  : -7.09882e-05 ± 9.36934e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [8, 10, 44, 50, 61, 64, 68, 72, 83, 87, 90, 96, 104, 111, 115, 116, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [4, 8, 9, 12, 16, 29, 37, 49, 64, 107, 122, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3183', '1.800', '0.1476', '1.800', '0.1031', '7.000', '0.7077', 1, 1, 1, 1, 1724313525.2646935]
VI_after__Init : ['1.201', '0.3192', '1.800', '0.1481', '1.801', '0.0970', '7.000', '0.7076', 1, 1, 1, 1, 1724313533.3880641]
VI_at__the_End : ['1.201', '0.4305', '1.800', '0.1323', '1.799', '0.1275', '7.000', '0.7085', 1, 1, 1, 1, 1724313592.6064167]