TEST_NAME : Wafer
TEST_DATE : 24_08_22-10_09_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-004-006-12 | FUSED_ID : 6359364768384434284
  IC_TEMP :  -82.75 | VDDM : 1115.26 | AUX_INT :  -41.49 | CsaBias :   24.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.99135e-03 / 2
  ADC_P0  : -4.14858e-02 ± 3.93716e-02
  ADC_P1  : 9.42226e-03 ± 1.00473e-03
  ADC_P2  : -8.28418e-06 ± 5.11713e-06
  CSA_Chi2/NDF : 2.00450e-04 / 2
  CSA_P0  : 5.84454e-02 ± 9.44334e-03
  CSA_P1  : 1.06122e-02 ± 7.11488e-04
  CSA_P2  : -7.12510e-05 ± 1.08351e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [14, 33, 35, 38, 39, 40, 41, 51, 66, 69, 86, 100, 104, 106, 107, 111, 119, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [2, 20, 21, 33, 35, 46, 70, 73, 74, 95, 111, 118, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3148', '1.800', '0.1483', '1.799', '0.1007', '7.000', '0.7079', 1, 1, 1, 1, 1724314189.4177363]
VI_after__Init : ['1.201', '0.3124', '1.800', '0.1486', '1.801', '0.0949', '7.000', '0.7078', 1, 1, 1, 1, 1724314197.5422027]
VI_at__the_End : ['1.201', '0.4414', '1.800', '0.1348', '1.800', '0.1289', '7.000', '0.7085', 1, 1, 1, 1, 1724314265.065196]