TEST_NAME : Wafer
TEST_DATE : 24_08_22-10_13_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-004-008-12 | FUSED_ID : 6359364768384434316
  IC_TEMP :  -82.09 | VDDM : 1118.12 | AUX_INT :  -10.08 | CsaBias :   51.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53788e-03 / 2
  ADC_P0  : -1.00751e-02 ± 2.65374e-02
  ADC_P1  : 8.85232e-03 ± 6.71708e-04
  ADC_P2  : -7.06683e-06 ± 3.38352e-06
  CSA_Chi2/NDF : 1.98725e-04 / 2
  CSA_P0  : 5.72922e-02 ± 9.40262e-03
  CSA_P1  : 1.03524e-02 ± 7.08420e-04
  CSA_P2  : -6.52189e-05 ± 1.07884e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [1, 9, 25, 29, 40, 42, 50, 54, 62, 65, 73, 82, 95, 113, 115, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [13, 16, 17, 24, 26, 34, 40, 42, 54, 57, 60, 64, 80, 86]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1843', '1.800', '0.1357', '1.800', '0.0891', '7.000', '0.7081', 1, 1, 1, 1, 1724314379.9995475]
VI_after__Init : ['1.201', '0.1843', '1.800', '0.1357', '1.801', '0.0836', '7.000', '0.7078', 1, 1, 1, 1, 1724314388.2298472]
VI_at__the_End : ['1.194', '0.4417', '1.800', '0.1346', '1.812', '0.1244', '7.000', '0.7088', 1, 1, 1, 1, 1724314455.529898]