TEST_NAME : Wafer
TEST_DATE : 24_08_22-10_17_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-004-011-12 | FUSED_ID : 6359364768384434364
  IC_TEMP :  -77.56 | VDDM : 1121.15 | AUX_INT :   -9.89 | CsaBias :   43.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53437e-03 / 2
  ADC_P0  : -9.89475e-03 ± 2.64984e-02
  ADC_P1  : 8.86380e-03 ± 6.68556e-04
  ADC_P2  : -7.33448e-06 ± 3.34837e-06
  CSA_Chi2/NDF : 1.68523e-04 / 2
  CSA_P0  : 6.02358e-02 ± 8.65868e-03
  CSA_P1  : 1.00102e-02 ± 6.52369e-04
  CSA_P2  : -6.03475e-05 ± 9.93480e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [2, 7, 32, 38, 40, 78, 88, 94, 103, 114, 120, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [3, 10, 24, 37, 47, 59, 62, 79, 85, 102, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3463', '1.800', '0.1234', '1.800', '0.1076', '7.000', '0.7080', 1, 1, 1, 1, 1724314666.6078296]
VI_after__Init : ['1.201', '0.3469', '1.800', '0.1238', '1.800', '0.1014', '7.000', '0.7079', 1, 1, 1, 1, 1724314674.8022895]
VI_at__the_End : ['1.201', '0.4469', '1.800', '0.1342', '1.799', '0.1245', '7.000', '0.7087', 1, 1, 1, 1, 1724314741.7832372]